Process variations and probabilistic integrated circuit design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality,...
Uloženo v:
| Další autoři: | , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781441966209 • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781489988607 • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781441966223 |
Obsah:
- Introduction
- Physical and Mathematical Fundamentals
- Examination of Process Parameter Variations
- Methods of Parameter Variations
- Consequences for Circuits Design and Case Studies
- Conclusion.