Process variations and probabilistic integrated circuit design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality,...
Enregistré dans:
| Autres auteurs: | , |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781441966209 • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781489988607 • Process Variations and Probabilistic Integrated Circuit Design, Texte imprimé, 9781441966223 |