Critical phenomena at surfaces and interfaces : Evanescent X-Ray and neutron scattering
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The...
Gorde:
| Egile nagusia: | |
|---|---|
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Saila: | Springer tracts in modern physics
126 |
| Gaiak: | |
| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Critical phenomena at surfaces and interfaces, Evanescent X-Ray and neutron scattering, Helmut Dosh, Berlin, Springer, 1992, 1 vol. (x-145 p.), Springer tracts in modern physics, 3-540-54534-4 • Critical Phenomena at Surfaces and Interfaces, Texte imprimé, 9783662149744 • Critical Phenomena at Surfaces and Interfaces, Texte imprimé, 9783662149751 |
Aurkibidea:
- Evanescent X-ray scattering
- Evanescent neutron scattering
- Semi-infinite critical systems
- Surface effects at first order phase transitions.