Critical phenomena at surfaces and interfaces : Evanescent X-Ray and neutron scattering

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The...

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Bibliographic Details
Main Author: Dosch, Helmut, 1955-...., physicien
Format: Livre numérique
Language:Anglais
Published: Berlin [etc.] : Springer [20..].
Cham : Springer Nature
Series:Springer tracts in modern physics 126
Subjects:
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Edition sous un autre format:• Critical phenomena at surfaces and interfaces, Evanescent X-Ray and neutron scattering, Helmut Dosh, Berlin, Springer, 1992, 1 vol. (x-145 p.), Springer tracts in modern physics, 3-540-54534-4
• Critical Phenomena at Surfaces and Interfaces, Texte imprimé, 9783662149744
• Critical Phenomena at Surfaces and Interfaces, Texte imprimé, 9783662149751
Description
Summary:This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Item Description:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9783540384564 (PDF)
ISSN:1615-0430
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