Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...
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| Autor principal: | |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Col·lecció: | Springer tracts in modern physics
182 |
| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission electron microscopy of semiconductor nanostructures, an analysis of composition and strain state, Andreas Rosenauer, New York, Springer, 2003, 1 vol. (XII-238 p.), Springer tracts in modern physics, 3-540-00414-9 • Transmission Electron Microscopy of Semiconductor Nanostructures, Texte imprimé, 9783662146170 • Transmission Electron Microscopy of Semiconductor Nanostructures, Texte imprimé, 9783662146187 |
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| 100 | 1 | |a Rosenauer, Andreas, |d 1964- | |
| 245 | 1 | 0 | |a Transmission electron microscopy of semiconductor nanostructures : |b an analysis of composition and strain state |c Andreas Rosenauer. |
| 260 | |a Berlin [etc.] : |b Springer. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer tracts in modern physics |v 182 |x 1615-0430 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Theoretical Fundamentals of Transmission Electron Microscopy -- Electron Diffraction -- Image Formation -- Digital Image Analysis -- Strain State Analysis -- Lattice Fringe Analysis -- Applications -- In0.6Ga0.4As/GaAs(001) SK Layers -- InAs Quantum Dots -- Electron Holography: AlAs/GaAs Superlattices -- Outlook. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and sources of error are all discussed. The techniques are applied to quantum wells and dots in order to give insight into kinetic growth effects such as segregation and migration. In the first part of the book the fundamentals of transmission electron microscopy are provided. These are needed for an understanding of the digital image analysis techniques described in the second part of the book. There the reader will find information on different methods of composition determination. The third part of the book focuses on applications such as composition determination in InGaAs Stranski--Krastanov quantum dots. Finally it is shown how an improvement in the precision of the composition evaluation can be obtained by combining CELFA with electron holography. This is demonstrated for an AlAs/GaAs superlattice. | ||
| 650 | |a Semiconducteurs |x Analyse | ||
| 650 | |a Semiconducteurs |x Microscopie | ||
| 650 | |a Microscopie électronique | ||
| 650 | |a Microscopie électronique en transmission | ||
| 776 | 0 | |0 07112392X |t Transmission electron microscopy of semiconductor nanostructures |o an analysis of composition and strain state |f Andreas Rosenauer |c New York |n Springer |d 2003 |p 1 vol. (XII-238 p.) |s Springer tracts in modern physics |z 3-540-00414-9 | |
| 776 | 0 | |t Transmission Electron Microscopy of Semiconductor Nanostructures |b Texte imprimé |z 9783662146170 | |
| 776 | 0 | |t Transmission Electron Microscopy of Semiconductor Nanostructures |b Texte imprimé |z 9783662146187 | |
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| 997 | |0 971364 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||