Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials
সংরক্ষণ করুন:
| প্রধান লেখক: | |
|---|---|
| বিন্যাস: | Livre numérique |
| ভাষা: | Anglais |
| প্রকাশিত: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| মালা: | Lecture notes in physics
204 |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| টীকা: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783540133599 • Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783662173701 |
সূচিপত্রের সারণি:
- A brief background of the present requirement for structural characterization of disordered materials
- Fundamental relationships between rdf and scattering intensity
- Definition of partial structure factors and compositional short range order (CSRO)
- Experimental determination of partial structural functions
- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials
- Theoretical aspects on the anomalous dispersion factors of x-rays
- Experimental determination of the anomalous dispersion factors
- Selected examples of structural determination using anomalous (resonance) x-ray scattering
- Relative merits of anomalous x-ray scattering and its future prospects.