Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials :: SCD d'Orléans

Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials

Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials

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Dettagli Bibliografici
Autore principale:	Waseda, Yoshio
Natura:	Livre numérique
Lingua:	Anglais
Pubblicazione:	Berlin [etc.] : Springer [20..]. Cham : Springer Nature
Serie:	Lecture notes in physics 204
Soggetti:	Cristallographie Physique
Accesso online:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783540133599 • Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783662173701

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