Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials
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| Hlavní autor: | |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Edice: | Lecture notes in physics
204 |
| Témata: | |
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Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783540133599 • Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials, Texte imprimé, 9783662173701 |
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| 041 | 0 | |a eng | |
| 082 | |a 530 | ||
| 100 | 1 | |a Waseda, Yoshio. | |
| 245 | 1 | 0 | |a Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials |c Yoshio Waseda. |
| 260 | |a Berlin [etc.] : |b Springer. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Lecture notes in physics |v 204 |x 1616-6361 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 650 | |a Cristallographie | ||
| 650 | |a Physique | ||
| 776 | 0 | |t Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials |b Texte imprimé |z 9783540133599 | |
| 776 | 0 | |t Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials |b Texte imprimé |z 9783662173701 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/BFb0025745 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-BW4NMZ2H-Z |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:750653957 |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/BFb0025745 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:754004074 |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/BFb0025745 |z Accès INSA CVL | |
| 997 | |0 971311 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||