Advances in pattern recognition : Joint IAPR International Workshops SSPR 2000 and SPR 2000, Alicante, Spain, August 30 September 1, 2000 : proceedings

This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awduron Corfforaethol: International Workshop on Structural and Syntactical Pattern Recognition :Alicante, Espagne, International Workshop on Statistical Techniques in Pattern Recognition (Awdur)
Awduron Eraill: Ferri, Francesc J. (Cyfarwyddwr cyhoeddi), Iñesta, José M., 19..- (Cyfarwyddwr cyhoeddi), Amin, Adnan, 1950- (Cyfarwyddwr cyhoeddi)
Fformat: Livre numérique
Iaith:Anglais
Cyhoeddwyd: Berlin [etc.] : Springer [20..].
Cham : Springer Nature
Cyfres:Lecture notes in computer science 1876
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Edition sous un autre format:• Advances in pattern recognition, joint IAPR International Workshops SSPR'2000 and SPR 2000, Alicante, Spain, August/September 2000, proceedings, Francesc J. Ferri ... [et al.] (eds.), 2000, Berlin, Springer, 1 vol. (XVIII-901 p.), Lecture notes in computer science, 3-540-67946-4
• Advances in Pattern Recognition, Texte imprimé, 9783662200995
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Crynodeb:This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.
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Archives Springer e-books (Licence nationale)
ISBN:9783540445227 (PDF)
ISSN:1611-3349
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