Three-dimensional X-ray diffraction microscopy : mapping polycrystals and their dynamics
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be...
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Col·lecció: | Springer tracts in modern physics
205 |
| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Three-dimensional X-ray diffraction microscopy, mapping polycrystals and their dynamics, Henning F. Poulsen, Berlin, Springer, 2004, 1 vol. (XI-154 p.), Springer tracts in modern physics, 3-540-22330-4 • Three-Dimensional X-Ray Diffraction Microscopy, Texte imprimé, 9783662145425 • Three-Dimensional X-Ray Diffraction Microscopy, Texte imprimé, 9783662145432 |