Scanning Transmission Electron Microscopy : Imaging and Analysis
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analys...
Enregistré dans:
| Andre forfattere: | , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
New York, NY :
Springer New York
2011.
Cham : Springer Nature |
| Fag: | |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning transmission electron microscopy, imaging and analysis, edited by Stephen J. Pennycook, Peter D. Nellist, 2011, Dordrecht, Springer, 1 vol. (XII-762 p.), 978-1-4419-7199-9 • Scanning Transmission Electron Microscopy, Texte imprimé, 9781441972019 |
Indholdsfortegnelse:
- Electron Optics and Aberration Correction
- Fundamentals of Scattering Theory
- Image formation in STEM
- Electron energy loss spectroscopy
- Energy dispersive x-ray analysis
- STEM of complex oxides
- STEM of complex alloys
- STEM of catalysts
- STEM of semiconductor devices
- STEM of ceramic materials
- STEM of quasicrystals
- STEM of nanomaterials
- 3D STEM: tomography
- 3D STEM: depth slicing
- Nanobeam diffraction.