Scanning Transmission Electron Microscopy : Imaging and Analysis
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analys...
保存先:
| その他の著者: | , |
|---|---|
| フォーマット: | Livre numérique |
| 言語: | Anglais |
| 出版事項: |
New York, NY :
Springer New York
2011.
Cham : Springer Nature |
| 主題: | |
| オンライン･アクセス: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| 注記: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning transmission electron microscopy, imaging and analysis, edited by Stephen J. Pennycook, Peter D. Nellist, 2011, Dordrecht, Springer, 1 vol. (XII-762 p.), 978-1-4419-7199-9 • Scanning Transmission Electron Microscopy, Texte imprimé, 9781441972019 |
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| 245 | 0 | 0 | |a Scanning Transmission Electron Microscopy : |b Imaging and Analysis |c edited by Stephen J. Pennycook,... Peter D. Nellist,... |
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| 500 | |a Archives Springer e-books (Licence nationale) | ||
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| 505 | 0 | |a Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction. | |
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| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. | ||
| 650 | |a Nanotechnologie | ||
| 650 | |a Microscopie | ||
| 650 | |a Matériaux optiques | ||
| 700 | 1 | |a Pennycook, Stephen J. |4 pbd | |
| 700 | 1 | |a Nellist, Peter D. |4 pbd | |
| 776 | 0 | |0 169904857 |t Scanning transmission electron microscopy |o imaging and analysis |f edited by Stephen J. Pennycook, Peter D. Nellist |d 2011 |c Dordrecht |n Springer |p 1 vol. (XII-762 p.) |z 978-1-4419-7199-9 | |
| 776 | 0 | |t Scanning Transmission Electron Microscopy |b Texte imprimé |z 9781441972019 | |
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