Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy
Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...
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| Format: | Livre numérique |
| Language: | Anglais |
| Published: |
New York, NY :
Springer New York : Springer e-books
[20..].
Cham : Springer Nature |
| Online Access: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
L'impression du document génère 562 p. Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning Probe Microscopy of Functional Materials, Texte imprimé, 9781441965677 |
| LEADER | 04913nam a22003497a 4500 | ||
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| 020 | |a 9781441971678 (en ligne) | ||
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| 100 | 1 | |a Kalinin, Sergei V. | |
| 245 | 1 | 0 | |a Scanning probe microscopy of functional materials : |b nanoscale imaging and spectroscopy |c edited by Sergei V. Kalinin, Alexei Gruverman. |
| 260 | |a New York, NY : |b Springer New York : |b Springer e-books. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 500 | |a L'impression du document génère 562 p. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a I. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires STM of ruthenates and manganites STM of superconductors STM of cuprates II. Semiconductor and photovoltaic materials: SPM of solar materials Cross-sectional STM of semiconductor heterostructures Charge dynamics in photovoltaic polymers III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes AFM/patch clamp in biology Electrical imaging of membranes Cell dynamics by Ion conductance microscopy Ferroelectric polymers IV. SPM of magnetic materials: Spin manipulation by STM Magnetic Resonant Force Microscopy Magnetic Force Microscopy V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM Polarization dynamics in relaxor ferroelectrics Piezoresponse Force Spectroscopy Polarization dynamics in capacitors and heterostructures VI. Mechanical properties: Nanomechanics by SPM Atomic Force Acoustic Microscopy of functional materials VII. Optical methods: NSOM and NSOM-transport NSOM Optical machines and unfolding Optically-assisted pump-probe STM VIII. Emerging SPM applications: STM/NC-AFM Scanning Non-linear Dielectric Microscopy Vibrational spectroscopy of single molecule Ultrafast ac STM SPM and electron microscopy combined In-situ STEM-nanoindentation Material characterization by SPM-focused X-ray combination *see Long ToC for tentative contributors | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: Serves the rapidly developing field of nanoscale characterization of functional materials properties Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization | ||
| 700 | 1 | |a Kalinin, Sergei V. |4 edt | |
| 700 | 1 | |a Gruverman, Alexei, |d 19..- |4 edt | |
| 776 | 0 | |t Scanning Probe Microscopy of Functional Materials |b Texte imprimé |z 9781441965677 | |
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| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-V6PZL137-B |z Accès sur la plateforme Istex | |
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| 997 | |0 968118 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||