Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and...
Enregistré dans:
| Hovedforfatter: | |
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| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Udgivelse: | 1st ed. 2011. |
| Serier: | Frontiers in Electronic Testing
41 |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Soft Errors in Modern Electronic Systems, Texte imprimé, 9781461426899 • Soft Errors in Modern Electronic Systems, Texte imprimé, 9781441969927 • Soft Errors in Modern Electronic Systems, Texte imprimé, 9781441969941 |
| Summary: | Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors. |
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| Emne beskrivelse: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9781441969934 |
| Adgang: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |