Delay Fault Testing for VLSI Circuits :: SCD d'Orléans

Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits

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Opis bibliograficzny
Główni autorzy:	Krstić, Angela, Cheng, Kwang-Ting (Autor)
Format:	Livre numérique
Język:	Anglais
Wydane:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Dostęp online:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Komentarz:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Delay Fault Testing for VLSI Circuits, 978-1-4613-7561-6

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