Integrated Circuit Defect-Sensitivity: Theory and Computational Models :: SCD d'Orléans

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

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Dettagli Bibliografici
Autore principale:	Pineda de Gyvez, José, électronicien
Natura:	Livre numérique
Lingua:	Anglais
Pubblicazione:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Accesso online:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Integrated circuit defect-sensitivity, theory and computational models, by José Pineda de Gyvez, Boston, Kluwer Academic Publishers, 1993, xxiv, 167 p., The Kluwer internatioanl series in engineering and computer science, 0-7923-9306-6

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