Test and diagnosis for small-delay defects
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable meth...
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| Hlavní autoři: | , , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781441982964 • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781441982988 • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781489989529 |
Obsah:
- Introduction to VLSI Testing
- Delay Test and System-Delay Defects
- Long Path-Based Hybrid Method
- Process Variations- and Crosstalk-Aware Pattern Selection
- Power Supply Noise- and Crosstalk-Aware Hybrid Method
- SDD-Based Hybrid Method
- Maximizing Crosstalk Effect on Critical Paths
- Maximizing Power Supply Noise on Critical Paths
- Faster-than-at-speed Test
- Introduction to Diagnosis
- Diagnosing Noise-Induced SDDs by Using Dynamic SDF. .