Test and diagnosis for small-delay defects
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable meth...
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| Những tác giả chính: | , , |
|---|---|
| Định dạng: | Livre numérique |
| Ngôn ngữ: | Anglais |
| Được phát hành: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Truy cập trực tuyến: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Chú thích: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781441982964 • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781441982988 • Test and Diagnosis for Small-Delay Defects, Texte imprimé, 9781489989529 |