Atom probe microscopy
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...
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| Главные авторы: | , , , |
|---|---|
| Формат: | Livre numérique |
| Язык: | Anglais |
| Опубликовано: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Серии: | Springer Series in Materials Science
160 |
| Online-ссылка: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Примечание: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Atom Probe Microscopy, Texte imprimé, 9781461434351 • Atom Probe Microscopy, Texte imprimé, 9781461434375 • Atom Probe Microscopy, Texte imprimé, 9781489989390 |
Оглавление:
- Preface
- Acknowledgements
- List of Acronyms and Abbreviations
- List of Terms
- List of Non-SI Units and Constant Values
- PART I Fundamentals
- 1. Introduction
- 2. Field Ion Microscopy
- 3 From Field Desorption Microscopy to Atom Probe Tomography
- Part II Practical aspects
- 4. Specimen Preparation
- 5. Experimental protocols in Field Ion Microscopy
- 6. Experimental protocols
- 7. Tomographic reconstruction
- PART III Applying atom probe techniques for materials science
- 8. Analysis techniques for atom probe tomography
- 9. Atom probe microscopy and materials science
- Appendices.