Modeling Nanoscale Imaging in Electron Microscopy
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...
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| Autor Principal: | |
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| Outros autores: | , |
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Series: | Nanostructure Science and Technology
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| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Modeling Nanoscale Imaging in Electron Microscopy, Texte imprimé, 9781489997289 • Modeling Nanoscale Imaging in Electron Microscopy, Texte imprimé, 9781461421924 • Modeling nanoscale imaging in electron microscopy, Thomas Vogt, Wolfgang Dahmen, Peter Binev, editors, New York, Springer, 2012, 1 vol. (ix-182 p.), Nanostructure science and technology, 978-1-461-42190-0 |