Modeling Nanoscale Imaging in Electron Microscopy
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...
Enregistré dans:
| 主要作者: | |
|---|---|
| 其他作者: | , |
| 格式: | Livre numérique |
| 語言: | Anglais |
| 出版: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| 叢編: | Nanostructure Science and Technology
|
| 在線閱讀: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| 提示: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Modeling Nanoscale Imaging in Electron Microscopy, Texte imprimé, 9781489997289 • Modeling Nanoscale Imaging in Electron Microscopy, Texte imprimé, 9781461421924 • Modeling nanoscale imaging in electron microscopy, Thomas Vogt, Wolfgang Dahmen, Peter Binev, editors, New York, Springer, 2012, 1 vol. (ix-182 p.), Nanostructure science and technology, 978-1-461-42190-0 |
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| 100 | 1 | |a Vogt, Thomas. | |
| 245 | 1 | 0 | |a Modeling Nanoscale Imaging in Electron Microscopy |c edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev. |
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c 2012. | ||
| 490 | 0 | |a Nanostructure Science and Technology |x 2197-7976 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Statistical and Information-Theoretic Analysis of Resolution in Imaging -- (Scanning) Transmission Electron Microscopy: Overview and Examples for the Non-Microscopist -- Seeing Atoms in the Crossroads of Microscopy and Mathematics -- Kantianism at the Nanoscale -- Reference free cryo-EM algorithms using self-consistent data fusion -- Reference free cryo-EM algorithms using self-consistent data fusion -- Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images -- Compressed Sensing -- Imaging the behavior of atoms, clusters and nanoparticles during elevated temperature experiments in an aberration-corrected electron microscope -- Towards Quantitative Imaging using Aberration Correction and Exit Wave Reconstruction -- Image registration, classification and averaging in cryo-electron tomography -- (Scanning) Transmission Electron Microscopy with High spatial, temporal and energy resolution -- Fluctuation Microscopy: Nanoscale Order in Amorphous Materials from Electron Nanodiffraction -- Information in super-resolution microscopy and automated analysis of large-scale calcium imaging data -- Concluding remarks on Imaging in Electron Microscopy. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. | ||
| 700 | 1 | |a Dahmen, Wolfgang. |4 pbd | |
| 700 | 1 | |a Binev, Peter. |4 pbd | |
| 776 | 0 | |t Modeling Nanoscale Imaging in Electron Microscopy |b Texte imprimé |z 9781489997289 | |
| 776 | 0 | |t Modeling Nanoscale Imaging in Electron Microscopy |b Texte imprimé |z 9781461421924 | |
| 776 | 0 | |0 165717718 |t Modeling nanoscale imaging in electron microscopy |f Thomas Vogt, Wolfgang Dahmen, Peter Binev, editors |c New York |n Springer |d 2012 |p 1 vol. (ix-182 p.) |s Nanostructure science and technology |z 978-1-461-42190-0 | |
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