Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design o...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Livre numérique |
| Sprache: | Anglais |
| Veröffentlicht: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Online Zugang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmerkung: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781461407874 • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781461407898 • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781489987877 |
Inhaltsangabe:
- Fundamentals of Statistical Analysis
- Statistical Full-Chip Leakage Power Analysis
- Statistical Full-Chip Dynamic Power Analysis
- Statistical Parasitic Extraction
- Statistical Compact Modeling and Reduction of Interconnects
- Statistical Analysis of Global Interconnects
- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits.