APA-Zitierstil (7. Ausg.)

Hamdioui, S. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Springer International Publishing.

Chicago-Zitierstil (17. Ausg.)

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Cham: Springer International Publishing.

MLA-Zitierstil (8. Ausg.)

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Springer International Publishing.