Richter, W., & Bauer, G. Optical Characterization of Epitaxial Semiconductor Layers. Springer International Publishing.
Style de citation Chicago (17e éd.)Richter, Wolfgang, et Günther Bauer. Optical Characterization of Epitaxial Semiconductor Layers. Cham: Springer International Publishing.
Style de citation MLA (8e éd.)Richter, Wolfgang, et Günther Bauer. Optical Characterization of Epitaxial Semiconductor Layers. Springer International Publishing.
警告：這些引文格式不一定是100％准確.