Defects in SiO :: SCD d'Orléans

Defects in SiO

Defects in SiO

Guardat en:

Dades bibliogràfiques
Altres autors:	Pacchioni, Gianfranco, 1954- (Col·laborador), Griscom, David L. (Col·laborador), Skuja, Linards (Col·laborador)
Format:	Livre numérique
Idioma:	Anglais
Publicat:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Accés en línia:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Defects in SiO2 and related dielectrics, science and technology, edited by G. Pacchioni, L. Skuja, D.L. Griscom, Dordrecht, Netherlands, Kluwer Academic Publishers, 2000, 1 vol. (VIII-624 p.), NATO science series, 0-7923-6685-9

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