On-Line Testing for VLSI :: SCD d'Orléans

On-Line Testing for VLSI

On-Line Testing for VLSI

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Detalhes bibliográficos
Outros Autores:	Pradan, Dhiraj K. (Colaborador), Zorian, Yervan (Colaborador), Nicolaïdis, Michael, 19..-...., microélectronicien (Colaborador)
Formato:	Livre numérique
Idioma:	Anglais
Publicado em:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Acesso em linha:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• On-Line Testing for VLSI, 978-1-4419-5033-8

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