Atomic Force Microscopy Based Nanorobotics : Modelling, Simulation, Setup Building and Experiments
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...
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| Auteurs principaux: | , , , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Serier: | Springer Tracts in Advanced Robotics
71 |
| Fag: | |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
L'impression du document génère 350 p. Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Atomic Force Microscopy Based Nanorobotics, Texte imprimé, 9783642203282 • Atomic Force Microscopy Based Nanorobotics, Texte imprimé, 9783642445019 • Atomic Force Microscopy Based Nanorobotics, Texte imprimé, 9783642203305 |