Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. Th...
Αποθηκεύτηκε σε:
| Κύριος συγγραφέας: | |
|---|---|
| Μορφή: | Livre numérique |
| Γλώσσα: | Anglais |
| Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Έκδοση: | 1st ed. 2005. |
| Σειρά: | Springer Series in Materials Science
85 |
| Διαθέσιμο Online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Σημείωση: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Lifetime spectroscopy, a method of defect characterization in silicon for photovoltaic applications, S. Rein, Berlin, Springer, 2005, 1 vol (XXVI-489 p.), Springer series in material science, 3-540-25303-3 |
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| 100 | 1 | |a Rein, Stefan. | |
| 245 | 1 | 0 | |a Lifetime Spectroscopy : |b A Method of Defect Characterization in Silicon for Photovoltaic Applications |c by Stefan Rein. |
| 250 | |a 1st ed. 2005. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer Series in Materials Science |v 85 |x 2196-2812 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Theory of carrier lifetime in silicon Lifetime measurement techniques Theory of lifetime spectroscopy Defect characterization on intentionally metal-contaminated silicon samples The metastable defect in boron-doped Czochralski silicon Summary and further work Zusammenfassung und Ausblick | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy | ||
| 776 | 0 | |0 095048243 |t Lifetime spectroscopy |o a method of defect characterization in silicon for photovoltaic applications |f S. Rein |c Berlin |n Springer |d 2005 |p 1 vol (XXVI-489 p.) |s Springer series in material science |z 3-540-25303-3 | |
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