Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. Th...

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Autor principal: Rein, Stefan
Format: Livre numérique
Idioma:Anglais
Publicat: Berlin, Heidelberg : Springer Berlin Heidelberg [20..].
Cham : Springer Nature
Edició:1st ed. 2005.
Col·lecció:Springer Series in Materials Science 85
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Edition sous un autre format:• Lifetime spectroscopy, a method of defect characterization in silicon for photovoltaic applications, S. Rein, Berlin, Springer, 2005, 1 vol (XXVI-489 p.), Springer series in material science, 3-540-25303-3
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Sumari:Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy
Descripció de l’ítem:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9783540279228
ISSN:2196-2812
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