Ferroelectric Thin Films : Basic Properties and Device Physics for Memory Applications

Ferroelectric thin films continue to attract much attention due to their developing, diverse applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties o...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Ishibashi, Yoshihiro
مؤلفون آخرون: Okuyama, Masanori, 1946- (مدير النشر)
التنسيق: Livre numérique
اللغة:Anglais
منشور في: Berlin, Heidelberg : Springer Berlin Heidelberg [20..].
Cham : Springer Nature
الطبعة:1st ed. 2005.
سلاسل:Topics in Applied Physics 98
الموضوعات:
الوصول للمادة أونلاين:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
ملاحظة: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Ferroelectric thin films, basic properties and device physics for memory applications, Masanori Okuyama, Yoshihiro Ishibashi (eds.), Berlin, Springer, 2005, 1 vol. (XIII-244 p.), Topics in applied physics, 3-540-24163-9
• Ferroelectric Thin Films, Texte imprimé, 9783642063305
• Ferroelectric Thin Films, Texte imprimé, 9783540806295
• Ferroelectric thin films, basic properties and device physics for memory applications, Masanori Okuyama, Yoshihiro Ishibashi (eds.), Berlin, Springer, 2005, 1 vol. (XIII-244 p.), Topics in applied physics, 3-540-24163-9
جدول المحتويات:
  • Theoretical Aspects of Phase Transitions in Ferroelectric Thin Films Chemical Solution Deposition of Layered-Structured Ferroelectric Thin Films PB-Based Ferroelectric Thin Films Prepared by MOCVD Spontaneous Polarization and Crystal Orientation Control of MOCVD PZT and Bi4Ti3O12-Based Films Rhombohedral PZT Thin Films Prepared by Sputtering Scanning Nonlinear Dielectric Microscope Analysis of Ferroelectricity and Enhanced Piezoelectricity near Morphotropic Phase Boundary Correlation between Domain Structures in Dielectric Properties in Single Crystals of Ferroelectric Solid Solutions Relaxor Behaviors in Perovskite-Type Dielectric Compounds Artificial Control of Ordered/Disordered State of B-Site Ions in Ba(Zr,Ti)O3 by a Superlattice Technique Physics of Ferroelectric Interface: An Attempt to Nano-Ferrolectric Physics Preparation and Property of Ferroelectic-Insulator-Semiconductor Junction Using YMNO3 Thin Film Improvement of Memory Retention in Metal-Ferroelectric-Insulator-Semiconductor (MFIS) Structure