Fault diagnosis of analog integrated circuits

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast,...

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Autors principals: Kabisatpathy, Prithviraj, Barua, Alok (Autor), Sinha, Satyabroto (Autor)
Format: Livre numérique
Idioma:Anglais
Publicat: New York, NY : Springer US 2005.
Cham : Springer Nature
Col·lecció:Frontiers in Electronic Testing 30
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Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Fault Diagnosis of Analog Integrated Circuits, Texte imprimé, 9780387257426
• Fault Diagnosis of Analog Integrated Circuits, Texte imprimé, 9781441938282
• Fault Diagnosis of Analog Integrated Circuits, Texte imprimé, 9780387506869
Taula de continguts:
  • Introduction. Basic test issues. Introduction. A review of analogue fault diagnosis
  • Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme. Introduction. The diagnosis procedure. The test stimulus generation. The fault modelling. Approximation modelling of the analogue integrated circuits. Artificial neural networks: an overview. Summary and conclusions
  • Fault Diagnosis in Stand-alone Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained
  • Fault Diagnosis in Embedded Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained
  • Experimental Verification of the Fault Diagnosis Methodology. Introduction. The hardware realisation. Experimental results. Discussion on the results obtained
  • Conclusions. Results and discussions
  • Appendix. A.Typical BJT SPICE parameter values of the A741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp
  • Bibliography.