Data Mining and Diagnosing IC Fails
Datamining and Diagnosing Integrated Circuit Fails addresses the problem of obtaining maximum information from (functional) Integrated Circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to...
Salvato in:
| Autore principale: | |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
New York, NY :
Springer US
2005.
Cham : Springer Nature |
| Serie: | Frontiers in Electronic Testing
31 |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Data Mining and Diagnosing IC Fails, Texte imprimé, 9781441937674 • Data Mining and Diagnosing IC Fails, Texte imprimé, 9780387505541 • Data Mining and Diagnosing IC Fails, Texte imprimé, 9780387249933 |
Sommario:
- Introduction
- Statistics
- Yield Statistics
- Area Dependence of the Yield
- Statistics of Embedded Object Fails
- Fail Commonalities
- Spatial Patterns
- Test Coverage and Test Fallout
- Logic Diagnosis
- Slat Based Diagnosis
- Data Collection Requirements
- Appendix A. Distribution of IC Fails
- Appendix B. General Yield Model
- Appendix C. Simplified Center-Satellite Model
- Appendix D. Quadrat Analysis
- Appendix E. Cell Fail Probabilities
- Appendix F. Characterization Group
- Appendix G. Component Fail Probabilities
- Appendix H. Yield and Coverage
- Appendix I. Estimating First Fail Probabilities from the Fallout
- Appendix J. Identity of M and S
- References
- Index.