Data Mining and Diagnosing IC Fails
Datamining and Diagnosing Integrated Circuit Fails addresses the problem of obtaining maximum information from (functional) Integrated Circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to...
Shranjeno v:
| Glavni avtor: | |
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| Format: | Livre numérique |
| Jezik: | Anglais |
| Izdano: |
New York, NY :
Springer US
2005.
Cham : Springer Nature |
| Serija: | Frontiers in Electronic Testing
31 |
| Online dostop: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Sporočilo: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Data Mining and Diagnosing IC Fails, Texte imprimé, 9781441937674 • Data Mining and Diagnosing IC Fails, Texte imprimé, 9780387505541 • Data Mining and Diagnosing IC Fails, Texte imprimé, 9780387249933 |