Introduction to focused ion beams : instrumentation, theory, techniques and practice
The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition, and over the past few years, the FIB has gained acceptance as more than just an expensive sample preparation tool. It h...
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| Outros Autores: | , |
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| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado em: |
Boston, MA :
Springer US : Imprint: Springer
[20..].
Cham : Springer Nature |
| Acesso em linha: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Introduction to focused ion beams, instrumentation, theory, techniques, and pratice, edited by Lucille A. Giannuzzi,..., Fred A. Stevie,..., New York, Springer Science +Business MEDIA, 2005, 1 vol. (XIV-357p.), 0-387-23116-1 |