Electromigration modeling at circuit layout level
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has...
Guardat en:
| Autors principals: | , |
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| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Singapore :
Springer Nature Singapore
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2013. |
| Col·lecció: | SpringerBriefs in Reliability
|
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Electromigration Modeling at Circuit Layout Level, Texte imprimé, 9789814451222 • Electromigration modeling at circuit layout level, Cher Ming Tan, Feifei He, Singapore, Springer, 2013, 1 vol. (x-103 p.), SpringerBriefs in applied sciences and technology, 978-981-445120-8 |
| Sumari: | Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief addresses the readers to the necessity of 3D real circuit modelling in order to evaluate the EM of interconnect system in ICs, and how they can create such models for their own applications. A 3-dimensional (3D) electro-thermo-structural model as opposed to the conventional current density based 2-dimensional (2D) models is presented at circuit-layout level. |
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| Descripció de l’ítem: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9789814451215 |
| ISSN: | 2196-1131 |
| Accés: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |