Photo-excited charge collection spectroscopy : probing the traps in field-effect transistors
Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...
Guardado en:
| Autores principales: | , , |
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| Formato: | Livre numérique |
| Lenguaje: | Anglais |
| Publicado: |
Dordrecht :
Springer Netherlands
2013.
Cham : Springer Nature |
| Colección: | SpringerBriefs in Physics
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| Acceso en línea: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Photo-Excited Charge Collection Spectroscopy, Probing the traps in field-effect transistors, by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim, Dordrecht, Springer, 2013, 1 vol. (XI-101 p.), Springer briefs in physics, 978-94-007-6391-3 • Photo-Excited Charge Collection Spectroscopy, Texte imprimé, 9789400763937 |
Tabla de Contenidos:
- Chapter 1 Device Stability and Photo-Excited Charge-Collection Spectroscopy
- Chapter 2 Instrumentations for PECCS
- Chapter 3 PECCS measurements in Organic FETs
- Chapter 4 PECCS measurements in Oxide FETs
- Chapter 5 PECCS measurements in Nanostructure FETs
- Chapter 6 Summary and limiting factors of PECCS.