Photo-excited charge collection spectroscopy : probing the traps in field-effect transistors
Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...
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| Autori principali: | , , |
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| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Dordrecht :
Springer Netherlands
2013.
Cham : Springer Nature |
| Serie: | SpringerBriefs in Physics
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| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Photo-Excited Charge Collection Spectroscopy, Probing the traps in field-effect transistors, by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim, Dordrecht, Springer, 2013, 1 vol. (XI-101 p.), Springer briefs in physics, 978-94-007-6391-3 • Photo-Excited Charge Collection Spectroscopy, Texte imprimé, 9789400763937 |