Im, S., Chang, Y. G., & Kim, J. H. (2013). Photo-excited charge collection spectroscopy: Probing the traps in field-effect transistors. Springer Netherlands.
Citace podle Chicago (17th ed.)Im, Seongil, Youn Gyoung Chang, a Jae Hoon Kim. Photo-excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Dordrecht: Springer Netherlands, 2013.
Citace podle MLA (8th ed.)Im, Seongil, et al. Photo-excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Springer Netherlands, 2013.
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