Scanning probe microscopy : characterization, nanofabrication and device application of functional materials
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...
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| Collectivités auteurs: | , |
|---|---|
| Autres auteurs: | , , |
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2005. |
| Collection: | NATO Science Series II: Mathematics, Physics and Chemistry, Mathematics, Physics and Chemistry
186 |
| Sujets: | |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
L'impression du document génère XXXVII-488 p. Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning probe microscopy, characterization, nanofabrication and device application of functional materials, edited by Paula Maria Vilarinho, Yossi Rosenwaks and Angus Kingon, Dordrecht, Kluwer Academic Publishers, 2005, 1 vol. (XXXVII-488 p.), NATO science series, 1-4020-3017-7 |