Solder joint reliability prediction for multiple environments

Solder Joint Reliability Prediction for Multiple Environments provides industry engineers, graduate students, academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments. Th...

詳細記述

保存先:
書誌詳細
主要な著者: Perkins, Andrew E., Sitaraman, Suresh K. (著者)
フォーマット: Livre numérique
言語:Anglais
出版事項: New York, NY : Springer US 2009.
Cham : Springer Nature
主題:
オンライン・アクセス:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
注記: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Solder Joint Reliability Prediction for Multiple Environments, Texte imprimé, 9781441946348
• Solder Joint Reliability Prediction for Multiple Environments, Texte imprimé, 9780387570983
• Solder Joint Reliability Prediction for Multiple Environments, Texte imprimé, 9780387793931
LEADER 04572nam a22003737a 4500
001 943704
008 110722s2009 xx ||| |||| 00| 0 eng d
009 PPN153863684
020 |a 9780387793948 
041 0 |a eng 
082 |a 621.381046 22 
100 1 |a Perkins, Andrew E. 
245 1 0 |a Solder joint reliability prediction for multiple environments   |c by Andrew E. Perkins, Suresh K. Sitaraman. 
260 |a New York, NY :  |b Springer US. 
260 |a Cham :  |b Springer Nature,  |c 2009. 
500 |a Archives Springer e-books (Licence nationale) 
500 |a Archives Springer e-books (Licence nationale) 
505 0 |a Background -- Literature Review -- Unified Finite Element Modeling for Prediction of Solder Joint Fatigue -- Validation of Unified FEM for Thermal Cycling and Power -- Development of Fatigue Life Equations Under Low-Cycle Thermal and Power Cycling -- Validation of Unified FEM and Development of Fatigue-life Equations for Vibration -- Universal Predictive Fatigue Life Equation and the Effect of Design Parameters -- Acceleration Factor to Relate Thermal Cycles to Power Cycles for CBGA Packages -- Solder Joint Fatigue Failure under Sequential Thermal and Vibration Environments -- Solder Joint Reliability Assessment for Desktop and Space Applications. 
506 |a Accès en ligne pour les établissements français bénéficiaires des licences nationales 
506 |a Accès soumis à abonnement pour tout autre établissement 
506 |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 
520 |a Solder Joint Reliability Prediction for Multiple Environments provides industry engineers, graduate students, academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments. The material presented here is not limited to ceramic area array packages only, it can also be used as a methodology for relating numerical simulations and experimental data into an easy-to-use equation that captures the essential information needed to predict solder joint reliability. Such a methodology is often needed to relate complex information in a simple manner to managers and non-experts in solder joint who work with computer server applications as well as for harsh environments such as those found in the defense, space, and automotive industries. Drawing upon years of practical experience and using numerous examples and illustrative applications, Andrew Perkins and Suresh Sitaraman cover state of the art technologies in solder joint reliability, including: A comprehensive summary of current literature on lead-containing ceramic area array electronic package solder joining reliability, Useful and easy-to-use tools for predicting solder joint fatigue life under thermal cycling, and power cycling enviroments, New insight into solder joint reliability testing under multiple environments, including vibration environments, A methodology for predicting solder joint reliability using numerical simulations and experimental data under multiple environments that can be related to any package type. Solder Joint Reliability Prediction for Multiple Environments is a must have book for practitioners and researchers who specialize in solder. 
650 |a Appareils électroniques  |x Fiabilité 
650 |a Produit d'apport (brasage) 
650 |a Assemblages (technologie)  |x Fiabilité 
700 1 |a Sitaraman, Suresh K.  |4 aut 
776 0 |t Solder Joint Reliability Prediction for Multiple Environments  |b Texte imprimé  |z 9781441946348 
776 0 |t Solder Joint Reliability Prediction for Multiple Environments  |b Texte imprimé  |z 9780387570983 
776 0 |t Solder Joint Reliability Prediction for Multiple Environments  |b Texte imprimé  |z 9780387793931 
856 4 |q PDF  |u https://doi.org/10.1007/978-0-387-79394-8  |z Accès sur la plateforme de l'éditeur 
856 4 |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-HZ5BG45T-H  |z Accès sur la plateforme Istex 
856 4 |5 452349901:747837112  |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/978-0-387-79394-8  |z Accès Université d'Orléans 
856 4 |5 180339901:750854618  |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/978-0-387-79394-8  |z Accès INSA CVL 
997 |0 943704  |1 Livre numérique  |a Ressource numérique  |b INSA  |b ENSA  |c 0/Bibliothèque numérique/  |c 1/Bibliothèque numérique/Autre ressource numérique/