Robust Computing with Nano-scale Devices : Progresses and Challenges

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic bar...

Celý popis

Uloženo v:
Podrobná bibliografie
Hlavní autor: Huang, Chao (Šéfredaktor, odpovědný redaktor)
Médium: Livre numérique
Jazyk:Anglais
Vydáno: Dordrecht : Springer Netherlands 2010.
Cham : Springer Nature
Edice:Lecture Notes in Electrical Engineering 58
On-line přístup:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Poznámka: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Robust Computing with Nano-scale Devices, Texte imprimé, 9789048185399
• Robust Computing with Nano-scale Devices, Texte imprimé, 9789048185412
• Robust Computing with Nano-scale Devices, Texte imprimé, 9789400731837
Obsah:
  • Fault Tolerant Nanocomputing
  • Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
  • Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays
  • Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics
  • The Prospect and Challenges of CNFET Based Circuits: A Physical Insight
  • Computing with Nanowires: A Self Assembled Neuromorphic Architecture
  • Computational Opportunities and CAD for Nanotechnologies.