Robust Computing with Nano-scale Devices : Progresses and Challenges

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic bar...

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主要作者: Huang, Chao (Directeur de la publication)
格式: Livre numérique
語言:Anglais
出版: Dordrecht : Springer Netherlands 2010.
Cham : Springer Nature
叢編:Lecture Notes in Electrical Engineering 58
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提示: Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Robust Computing with Nano-scale Devices, Texte imprimé, 9789048185399
• Robust Computing with Nano-scale Devices, Texte imprimé, 9789048185412
• Robust Computing with Nano-scale Devices, Texte imprimé, 9789400731837
實物特徵
總結:Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
Item Description:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9789048185405
ISSN:1876-1119
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