Power-aware testing and test strategies for low power devices
Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...
Shranjeno v:
| Drugi avtorji: | , , |
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| Format: | Livre numérique |
| Jezik: | Anglais |
| Izdano: |
New York, NY :
Springer US
2010.
Cham : Springer Nature |
| Teme: | |
| Online dostop: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Sporočilo: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Power-aware testing and test strategies for low power devices, edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen, New York, Springer, 2009, 1 vol. (XXIII-363 p.), 978-1-441-90927-5 • Power-Aware Testing and Test Strategies for Low Power Devices, Texte imprimé, 9781441909299 • Power-Aware Testing and Test Strategies for Low Power Devices, Texte imprimé, 9781489983138 |
Kazalo:
- Fundamentals of VLSI Testing
- Power Issues During Test
- Low-Power Test Pattern Generation
- Power-Aware Design-for-Test
- Power-Aware Test Data Compression and BIST
- Power-Aware System-Level Test Planning
- Low-Power Design Techniques and Test Implications
- Test Strategies for Multivoltage Designs
- Test Strategies for Gated Clock Designs
- Test of Power Management Structures
- EDA Solution for Power-Aware Design-for-Test.