Power-aware testing and test strategies for low power devices
Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...
Kaydedildi:
| Diğer Yazarlar: | , , |
|---|---|
| Materyal Türü: | Livre numérique |
| Dil: | Anglais |
| Baskı/Yayın Bilgisi: |
New York, NY :
Springer US
2010.
Cham : Springer Nature |
| Konular: | |
| Online Erişim: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Not: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Power-aware testing and test strategies for low power devices, edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen, New York, Springer, 2009, 1 vol. (XXIII-363 p.), 978-1-441-90927-5 • Power-Aware Testing and Test Strategies for Low Power Devices, Texte imprimé, 9781441909299 • Power-Aware Testing and Test Strategies for Low Power Devices, Texte imprimé, 9781489983138 |