Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, co...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Livre numérique |
| Sprache: | Anglais |
| Veröffentlicht: |
New York, NY :
Springer US
2010.
Cham : Springer Nature |
| Online Zugang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmerkung: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Analysis and Design of Resilient VLSI Circuits, Texte imprimé, 9781441909305 • Analysis and Design of Resilient VLSI Circuits, Texte imprimé, 9781441909329 • Analysis and Design of Resilient VLSI Circuits, Texte imprimé, 9781489985101 |
Inhaltsangabe:
- Soft Errors
- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits
- Analytical Determination of the Radiation-induced Pulse Shape
- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes
- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits
- Clamping Diode-based Radiation Tolerant Circuit Design Approach
- Split-output-based Radiation Tolerant Circuit Design Approach
- Process Variations
- Sensitizable Statistical Timing Analysis
- A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates
- Process Variation Tolerant Single-supply True Voltage Level Shifter
- Conclusions and Future Directions.