Sample Preparation Handbook for Transmission Electron Microscopy : Methodology

This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help y...

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書誌詳細
主要な著者: Ayache, Jeanne, 1951-, Beaunier, Luc (著者), Pottu-Boumendil, Jacqueline, 1939- (著者), Schmitt-Ehret, Gabrielle (著者), Laub, Danièle, 19..- (著者)
フォーマット: Livre numérique
言語:Anglais
出版事項: New York, NY : Springer New York [20..].
Cham : Springer Nature
版:1st ed. 2010.
オンライン・アクセス:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
注記: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Sample Preparation Handbook for Transmission Electron Microscopy, Texte imprimé, 9780387981819
目次:
  • Methodology: General Introduction to Materials The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) Materials Problems and Approaches for TEM and TEM/STEM Analyses Physical and Chemical Mechanisms of Preparation Techniques Artifacts in Transmission Electron Microscopy Selection of Preparation Techniques Based on Material Problems and TEM Analyses Comparisons of Techniques Conclusion: What Is a Good Sample?