Computational surface and roundness metrology

Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language inter...

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Autors principals: Muralikrishnan, Bala, Raja, Jay (Autor)
Format: Livre numérique
Idioma:Anglais
Publicat: London : Springer London [20..].
Cham : Springer Nature
Accés en línia:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Computational Surface and Roundness Metrology, Texte imprimé, 9781848002968
Taula de continguts:
  • Filtering A Brief History of Filtering Filtering in the Frequency Domain Filtering in the Time Domain Gaussian Filter The 2RC Filter Filtering Roundness Profiles Filtering 3D Surfaces Advanced Filtering Gaussian Regression Filters Spline Filter Robust Filters Envelope and Morphological Filters Multi-scale Filtering Fitting to Fitting Substitute Geometry Least-Squares Best-Fit Line and Plane Non-linear Least-Squares I: Introduction Non-linear Least-Squares II: Circle, Sphere, and Cylinder Fitting Radius-Suppressed Circle Data Exchange Algorithms for Minimum Zone Reference Circle-Fitting Using Linear Programming Simplex Parameterization Surface Finish Parameters I: Amplitude, Spacing, Hybrid, and Shape Surface Finish Parameters II: Autocorrelation, Power Spectral Density, Bearing Area 3D Surface Texture Parameters Errors and Uncertainty Uncertainty Considerations Uncertainty Propagation in Computations Error Separation Techniques in Roundness Metrology Other Relevant Topics