Computational surface and roundness metrology
Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language inter...
Đã lưu trong:
| Những tác giả chính: | , |
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| Định dạng: | Livre numérique |
| Ngôn ngữ: | Anglais |
| Được phát hành: |
London :
Springer London
[20..].
Cham : Springer Nature |
| Truy cập trực tuyến: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Chú thích: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Computational Surface and Roundness Metrology, Texte imprimé, 9781848002968 |
| Tóm tắt: | Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century. From the graduate student of metrology to the practicing engineer on the shop floor, Computational Surface and Roundness Metrology is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics |
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| Mô tả sách: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| số ISBN: | 9781848002975 |
| Truy cập: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |