Electron backscatter diffraction in materials science :: SCD d'Orléans

$Electron backscatter diffraction in materials science$

Electron backscatter diffraction in materials science

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...

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Dades bibliogràfiques
Altres autors:	Schwartz, Adam J. (Director editorial), Kumar, Mukul (Director editorial), Adams, Brent L. (Director editorial), Field, David P., 19..- (Director editorial)
Format:	Livre numérique
Idioma:	Anglais
Publicat:	Boston, MA : Springer US : Springer e-books [20..]. Cham : Springer Nature
Accés en línia:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Electron backscatter diffraction in materials science, Adam J. Schwartz, Mukul Kumar, Brent L. Adams... [et al.], editors, 2nd edition, New York, Springer, 2009, 1 vol. (XXII-403 p.), 0-387-88135-2

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