Electron backscatter diffraction in materials science
Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...
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| Otros Autores: | , , , |
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| Formato: | Livre numérique |
| Lenguaje: | Anglais |
| Publicado: |
Boston, MA :
Springer US : Springer e-books
[20..].
Cham : Springer Nature |
| Acceso en línea: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
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Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Electron backscatter diffraction in materials science, Adam J. Schwartz, Mukul Kumar, Brent L. Adams... [et al.], editors, 2nd edition, New York, Springer, 2009, 1 vol. (XXII-403 p.), 0-387-88135-2 |
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| 245 | 0 | 0 | |a Electron backscatter diffraction in materials science |c edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field. |
| 260 | |a Boston, MA : |b Springer US : |b Springer e-books. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Present State of Electron Backscatter Diffraction and Prospective Developments Dynamical Simulation of Electron Backscatter Diffraction Patterns Representations of Texture Energy Filtering in EBSD Spherical Kikuchi Maps and Other Rarities Application of Electron Backscatter Diffraction to Phase Identification Phase Identification Through Symmetry Determination in EBSD Patterns Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets 3D Reconstruction of Digital Microstructures Direct 3D Simulation of Plastic Flow from EBSD Data First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool Grain Boundary Networks Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections Strain Mapping Using Electron Backscatter Diffraction Mapping and Assessing Plastic Deformation Using EBSD Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques Application of EBSD Methods to Severe Plastic Deformation (SPD) and Related Processing Methods Applications of EBSD to Microstructural Control in Friction Stir Welding/Processing Characterization of Shear Localization and Shock Damage with EBSD Texture Separation for ?/? Titanium Alloys A Review of In Situ EBSD Studies Electron Backscatter Diffraction in Low Vacuum Conditions EBSD in the Earth Sciences: Applications, Common Practice, and Challenges Orientation Imaging Microscopy in Research on High Temperature Oxidation | |
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| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique | ||
| 700 | 1 | |a Schwartz, Adam J. |4 pbd | |
| 700 | 1 | |a Kumar, Mukul. |4 pbd | |
| 700 | 1 | |a Adams, Brent L. |4 pbd | |
| 700 | 1 | |a Field, David P., |d 19..- |4 pbd | |
| 776 | 0 | |0 13900842X |t Electron backscatter diffraction in materials science |f Adam J. Schwartz, Mukul Kumar, Brent L. Adams... [et al.], editors |e 2nd edition |c New York |n Springer |d 2009 |p 1 vol. (XXII-403 p.) |z 0-387-88135-2 | |
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